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Digital
Applications -
Vision Inspection Equipment Test
Digital Test
EADS
North America Defense Test & Services
has integrated VXI digital I/O capability in many ATE stations.
Digital I/O comes in several tiers :
-
Pattern
generation at speed
-
Boundary
scan
-
Control
signals
Pattern
Generation
EADS North
America Defense Test & Services
provides
digital signal generation up to 25MHz with a digital channel
density up to 192 channels in a 2-slot VXI configuration.
Each digital channel memory depth is 128K. Digital signal
levels are available from TTL to +/- 15 V. This digital I/O
is offered in many user-programmable formats : RTO, RTZ, RTC,
NR.
The digital systems has two modes: stimulus-response mode
and bus emulation mode.
In stimulus-response mode, digital patterns are generated
on the output channels. Digital inputs gather the test unit's
response and compare the responses to expected values.
In bus emulation mode, digital I/O channels are grouped to
reflect a target bus structure.
Boundary
Scan
EADS
North America Defense Test & Services
has VXI module solutions for test systems with JTAG (IEEE
1149.1) boundary scan requirements. The boundary scan implementation
has high-throughput, deep memory and real-time pattern comparison.
Control
Signals
EADS
North America Defense Test & Services
has single-slot VXI card implementation of digital I/O useful
for control functions. The VXI card has 96 I/O channels configurable
as TTL, CMOS or open-collector. The card is capable of generating
digital signal levels up to 32V and sinks up to 200mA per
channel.
The data rate bandwidth is 1KHz. ATE was designed to test
vision inspection equipment. The ATE performed functional
board testing on boards that process digital and video signals.
The testset included a 50MHz digital pattern generator interface,
a JTAG boundary scan interface, a multi-channel RS-232 interface,
a programmable clock generator, a multi-function frequency
counter, a high-density multiplexer, a digital I/O module
and a RGB video frame grabber.
The ATE simulated the UUT digital interfaces such as FIFOs,
memory, registers and digital comparators. The test fixture
ITA provided signal buffering, high-speed processing and a
bed-of-nails interface as well as connectorized interfaces.
Since the ITA was used for multiple board types, the ATE could
monitor a UUT identification output to determine which UUT
was installed and then run the specific UUT test suite.
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