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Semiconductor
Applications - Wafer and Hybrid Testing
Semiconductor testing can benefit greatly from
a VXI-based test solution. The ATE can easily be reconfigured
for each product and combines a broad range of instrumentation
with a small footprint. EADS North America Defense Test and
Services can provide ATE solutions from wafer to hybrid.
Wafer
Probe
This ATE was designed to evaluate RF frequency synthesizers
at the wafer level.
The frequency synthesizers consisted of RF inputs and outputs
and digital divider control logic and mode control logic.
The ATE test set included RF generators, a digital I/O interface,
and a 2 GHz oscilloscope. The test equipment was interfaced
to the wafer via a probe card consisting of high-speed wafer
probes for the RF signals and low-speed wafer probes for the
digital interface.
Hybrid
Testing
The ATE also was used to evaluate the hybrid into which the
frequency synthesizers were packaged. The ATE was configured
with additional equipment for noise testing.
High-speed ADC hybrids were tested by ATE configured with
spectrally pure RF signal generators to provide SNR, harmonics,
level ripple, and intermodulation. The VXI interface contained
RF routing relay switches and the ITA interface contained
a low-noise amplifier and high-rolloff filters.
The ADC digital output was acquired by a high-speed digital
interface. An FFT was performed on the digital data to produce
the final test results.
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